The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2013

Filed:

Nov. 11, 2009
Applicants:

Takashi Ichimura, Hitachinaka, JP;

Takeshi Ogashiwa, Hitachinaka, JP;

Yasuko Aoki, Hitachi, JP;

Inventors:

Takashi Ichimura, Hitachinaka, JP;

Takeshi Ogashiwa, Hitachinaka, JP;

Yasuko Aoki, Hitachi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01); H01J 37/28 (2006.01); G01N 23/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a charged particle beam device in which signal electrons () are generated from a sample when the sample () is irradiated with a primary charged particle beam (), and then enter different positions of a position-sensitive signal detector () in accordance with energy of the signal electrons (), whereby an energy distribution image of the signal electrons generated from the sample is acquired. Accordingly, it becomes possible to discriminate and select signal electrons having arbitrary energy to thereby obtain an image to which information specific to the arbitrary energy is reflected, and to acquire various characteristic information of the sample.


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