The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Aug. 16, 2011
Zuo Dai, Ottawa, CA;
Dick Liu, Saratoga, CA (US);
Ming Su, Nepean, CA;
Synopsys, Inc., Mountain View, CA (US);
Abstract
Roughly described, a design rule data set includes rules on derived layers. The rules are checked by traversing the corners of physical shapes, and for each corner, populating a layout topology database with values gleaned from that corner location, including values involving derived layers. After the layout topology database is populated, the values are compared to values in the design rule data set to detect any design rule violations, including violations of design rules defined on derived layers. Violations are reported in real time during manual editing of the layout. Preferably corner traversal is performed using scan lines oriented perpendicularly to edge orientations, scanning in the direction of the edge orientations. Scans stop only at corner positions on physical layers, and populate the layout topology database with what information can be gleaned based on the current scan line, including information about derived layers. The scans need not reach corners simultaneously.