The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Feb. 25, 2010
Applicant:

Michael Tompkins, San Francisco, CA (US);

Inventor:

Michael Tompkins, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/17 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and related systems are described for analyzing electromagnetic survey data. Electromagnetic survey data of a subterranean formation is obtained using at least a downhole transceiver deployed in a borehole and a transceiver positioned on the surface or in another borehole. The electromagnetic survey data includes an incident wave component and a scattered wave component. The incident and scattered components are correlated so as to generate an image of the subterranean formation indicating spatial locations of one or more features, for example, electrical properties such as resistivity variations, in the formation. The image is based at least in part on one or more interference patterns of the incident and scattered wave components. The correlation preferably includes generating a simulation of the incident wave component propagated into the formation, and convolving the simulated propagated incident wave component with the scattered wave component. The simulation can be performed using an analytic continuation or a fullwave simulation.


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