The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Mar. 07, 2011
Martin Muenker, Gevelsberg, DE;
Martin Muenker, Gevelsberg, DE;
YXLON International GmbH, Hamburg, DE;
Abstract
A laminography system includes a first linear guide defining a z-direction of a Cartesian coordinate system and an imaging radiation source fixable to the first linear guide and movable along the first linear guide. The radiation source is configured to form a cone of rays including a central ray defining a y-axis of the Cartesian coordinate system. A detector is disposed in a position so as to be struck at a center thereof by the central ray of the radiation source substantially in an x-direction of the Cartesian coordinate system. The system also includes a first rotation device configured to rotate the detector about a first axis of rotation that is parallel to a z-axis of the Cartesian coordinate system and that passes through an intersection of the central array and the detector. The detector is fixable to a second linear guide and is movable on the second linear guide along the first axis of rotation. An object slide is disposed between the radiation source and the detector. The object slide is configured to receive an object for inspection and is rotatable by a second rotation device about a second axis of rotation that is parallel to the first axis of rotation and that passes through an intersection of the central ray and the object for inspection.