The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Jul. 01, 2010
Kenji Watanabe, Takatsuki, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Yasujiro Yamada, Takatsuki, JP;
Atsushi Morikawa, Takatsuki, JP;
Kenji Watanabe, Takatsuki, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Yasujiro Yamada, Takatsuki, JP;
Atsushi Morikawa, Takatsuki, JP;
Rigaku Corporation, Tokyo, JP;
Abstract
An X-ray fluorescence analyzing method includes irradiating a liquid sample (A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (); measuring the intensity F of fluorescent X-rays () from each of elements in the sample (A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays () from the sample (A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays () is so chosen as to be shorter than that of the fluorescent X-rays () and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (A).