The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Jun. 26, 2009
John Carroll, Stockton on Tees, GB;
Simon Robert Gibbon, Northallerton, GB;
John Carroll, Stockton on Tees, GB;
Simon Robert Gibbon, Northallerton, GB;
Corn Products Development, Inc., Westchester, IL (US);
Abstract
A method of, and apparatus for, determining properties relating to multi-phase systems are provided. In the method, an array of sample tubes each containing a sample of a multi-phase system is formed. An iterative process is used to generate at least two data sets of transmitted and/or backscattered values for each sample and the data sets for each sample are processed to determine at least one property of the sample. The apparatus has a support on which an array of sample tubes each containing a sample of a multi-phase system may be assembled. It also has a wave source and at least one wave detector for detecting transmitted and/or backscattered values for each sample and computer means for iteratively operating said wave source and said at least one detector to generate data sets of transmitted and/or backscattered values for each sample and for processing the data sets for each sample to determine at least one property of the sample.