The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2013

Filed:

Jul. 15, 2011
Applicants:

Kwan-heum Lee, Suwon-si, KR;

Soon-wook Jung, Hwaseong-si, KR;

Jung-hyun Park, Seoul, KR;

Wook-je Kim, Gwacheon-si, KR;

Jong-sang Ban, Hwaseong-si, KR;

Inventors:

Kwan-Heum Lee, Suwon-si, KR;

Soon-Wook Jung, Hwaseong-si, KR;

Jung-Hyun Park, Seoul, KR;

Wook-Je Kim, Gwacheon-si, KR;

Jong-Sang Ban, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/337 (2006.01); H01L 21/8238 (2006.01); H01L 21/336 (2006.01); H01L 27/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a semiconductor device includes forming a gate structure on a substrate; forming a sacrificial spacer may be formed on a sidewall of the gate substrate; implanting first impurities into portions of the substrate by a first ion implantation process using the gate structure and the sacrificial spacer as ion implantation masks to form source and drain regions; removing the sacrificial spacer; and implanting second impurities and carbon atoms into portions of the substrate by a second ion implantation process using the gate structure as an ion implantation mask to form source and drain extension regions and carbon doping regions, respectively.


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