The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2013

Filed:

Jul. 12, 2010
Applicant:

Yutaka Miki, Kawasaki, JP;

Inventor:

Yutaka Miki, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical displacement meter includes: a spatial filter configured to extract light under measurement of a wavelength focused on a measurement target and to specify the wavelength of the light under measurement; a polarizer configured to divide the light collimated and caused to propagate in one direction into linearly polarized beams in two directions orthogonal to a propagating direction; a wavelength plate that allows passage of the linearly polarized beams to produce elliptically polarized light having a phase difference commensurate with a light wavelength; a polarized light separator configured to divide the elliptically polarized light into polarized light components in the two directions; and a computing circuit configured to perform computation of (A−B)/(A+B) by use of light quantity signals A and B, which respectively correspond to the two polarized light components.


Find Patent Forward Citations

Loading…