The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Dec. 18, 2009
Gautam Ashok Dusija, Milpitas, CA (US);
Jian Chen, Menlo Park, CA (US);
Chris Avila, Sunnyvale, CA (US);
Jianmin Huang, Sunnyvale, CA (US);
Lee M. Gavens, Milpitas, CA (US);
Gautam Ashok Dusija, Milpitas, CA (US);
Jian Chen, Menlo Park, CA (US);
Chris Avila, Sunnyvale, CA (US);
Jianmin Huang, Sunnyvale, CA (US);
Lee M. Gavens, Milpitas, CA (US);
SanDisk Technologies, Inc., Plano, TX (US);
Abstract
Data errors in non-volatile memory inevitably increase with usage and with higher density of bits stored per cell. The memory is configured to have a first portion operating with less error but of lower density storage, and a second portion operating with a higher density but less robust storage. Input data is written and staged in the first portion before being copied to the second portion. An error management provides checking the quality of the copied data for excessive error bits. The copying and checking are repeated on a different location in the second portion until either a predetermined quality is satisfied or the number or repeats exceeds a predetermined limit. The error management is not started when a memory is new with little or no errors, but started after the memory has aged to a predetermined amount as determined by the number of erase/program cycling its has experienced.