The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2013

Filed:

May. 18, 2011
Applicants:

Masami Terauchi, Miyagi, JP;

Takanori Murano, Tokyo, JP;

Nobuo Handa, Tokyo, JP;

Hideyuki Takahashi, Tokyo, JP;

Inventors:

Masami Terauchi, Miyagi, JP;

Takanori Murano, Tokyo, JP;

Nobuo Handa, Tokyo, JP;

Hideyuki Takahashi, Tokyo, JP;

Assignees:

Tohoku University, Miyagi, JP;

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 40/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray detection system has an electron beam irradiation portion, a diffraction grating, a splitter for distributing the direction of propagation of the diffracted X-rays such that an imaging plane for the diffracted X-rays is assigned to plural positions spaced apart in a direction perpendicular to the direction of energy dispersion of the diffracted X-rays, and image sensors different in energy sensitivity disposed respectively at the positions to which the imaging plane is assigned.


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