The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2013

Filed:

Jul. 29, 2010
Applicants:

Pervez M. Aziz, Dallas, TX (US);

Gregory W. Sheets, Breinigsville, PA (US);

Vladimir Sindalovsky, Perkasie, PA (US);

Inventors:

Pervez M. Aziz, Dallas, TX (US);

Gregory W. Sheets, Breinigsville, PA (US);

Vladimir Sindalovsky, Perkasie, PA (US);

Assignee:

Agere Systems LLC, Allentown, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 25/00 (2006.01); H04L 25/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for improving the performance of second order CDR systems. The integral state of the CDR system is initialized to a value that is based on an expected frequency profile that may be known a priori for certain applications. One or more quality of lock (QOL) metrics are also monitored that are derived from the integral register state value. A quality of a locking between a received signal and a local clock generated by a Clock and Data Recovery (CDR) system is evaluated by monitoring a state value of an integral register in a digital loop filter of the CDR system; evaluating one or more predefined criteria based on the integral register state value; and identifying a poor lock condition if the one or more predefined criteria are not satisfied.


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