The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
May. 22, 2008
Loren Carpenter, Nicasio, CA (US);
Dana Batali, Bainbridge Island, WA (US);
Julian Fong, Oakland, CA (US);
Loren Carpenter, Nicasio, CA (US);
Dana Batali, Bainbridge Island, WA (US);
Julian Fong, Oakland, CA (US);
Pixar, Emeryville, CA (US);
Abstract
Small objects causing aliasing are enlarged so that they are likely to be sampled by image sampling points. The opacity of the enlarged object is reduced in proportion to the enlargement. To efficiently render partially transparent objects, such as enlarged objects, objects are sampled using sigma buffer samples instead of image sample points. For each sigma buffer sample, a corresponding portion of the object is set to either completely transparent or completely opaque. The proportion of transparent to opaque portions of the object matches or approximates the partial transparency of the object as a whole. The completely opaque portions of one or more objects are sampled with the corresponding sigma buffer samples. Aggregate values of the sigma buffer samples are determined and can be combined with the attribute values of other objects sampled with image sampling points associated with the same region as the set of sigma buffer samples.