The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8415964 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 09, 2013

Filed:

Nov. 05, 2008
Applicants:

Toshihiro Yonezawa, Nirasaki, JP;

Shinichiro Takase, Nirasaki, JP;

Inventors:

Toshihiro Yonezawa, Nirasaki, JP;

Shinichiro Takase, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe card according to the present invention includes a support plate for supporting probes that contact an object to be inspected, a circuit board, a holding member for holding a lower surface of an outer peripheral portion of the support plate, and an abutting member disposed between the lower surface of the outer peripheral portion of the support plate and the holding member and protruding upward to abut to the lower surface of the outer peripheral portion of the support plate. Accordingly, horizontal expansion of the support plate itself is allowed, and at the time of inspecting electrical characteristics of the object to be inspected, even though the temperature of the support plate is increased and the support plate expands, the support plate can expand in a horizontal direction, thereby suppressing vertical deformation of the support plate.


Find Patent Forward Citations

Yonezawa, Toshihiro. (2013). Probe card having a structure for being prevented from deforming (U.S. Patent No. 8415964). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8415964

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