The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2013
Filed:
Feb. 24, 2011
Yoshihiro Osawa, Moriyama, JP;
Kazuaki Ohkubo, Kusatsu, JP;
Yoshihiro Osawa, Moriyama, JP;
Kazuaki Ohkubo, Kusatsu, JP;
Otsuka Electronics Co., Ltd., Hirakata-shi, JP;
Abstract
A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.