The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2013

Filed:

Dec. 31, 2009
Applicants:

Vincent Brendan Ashe, Campbell, CA (US);

Hakan C. Ozdemir, Los Gatos, CA (US);

Razmik Karabed, San Jose, CA (US);

Richard Barndt, San Diego, CA (US);

Inventors:

Vincent Brendan Ashe, Campbell, CA (US);

Hakan C. Ozdemir, Los Gatos, CA (US);

Razmik Karabed, San Jose, CA (US);

Richard Barndt, San Diego, CA (US);

Assignee:

STMicroelectronics, Inc., Carrollton, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for correcting errors in an ECC block using erasure-identification data when generating an error-locator polynomial. In an embodiment, a ECC decoding method, uses 'erasure' data indicative of bits of data that are unable to be deciphered by a decoder. Such a method may use an Berlekamp-Massey algorithm that receives two polynomials as inputs; a first polynomial indicative of erasure location in the stream of bits and a syndrome polynomial indicative of all bits as initially determined. The Berlekamp-Massey algorithm may use the erasure identification information to more easily decipher the overall codeword when faced with a error-filled codeword.


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