The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Dec. 19, 2008
Tomotaka Shinoda, Tokyo, JP;
Toshihiro Mitaka, Sapporo, JP;
Satoshi Mori, Sapporo, JP;
Naoki Watanabe, Sapporo, JP;
Hideki Ito, Sapporo, JP;
Tomotaka Shinoda, Tokyo, JP;
Toshihiro Mitaka, Sapporo, JP;
Satoshi Mori, Sapporo, JP;
Naoki Watanabe, Sapporo, JP;
Hideki Ito, Sapporo, JP;
Nikon Corporation, Tokyo, JP;
Sapporo Medical University, Hokkaido, JP;
Abstract
An inspection apparatus includes an imaging device and an image processing device. The imaging device photographs a specimen and outputs a color image of the specimen to the image processing device. The image processing device subjects the color image of the specimen to negative-positive reversal. After detecting a mode value of the hue the color image having been subjected to negative-positive reversal, the image processing device changes the hue of the color image in accordance with a difference between a boundary value of two predefined hues and the detected mode value. In accordance with the change of the hue, a plurality of target pixels different in the saturation is extracted and the saturation and the intensity of each pixel are changed, or the gradation of each pixel is converted so that the plurality of target pixels becomes most distant from one another in a color space.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile