The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2013
Filed:
Feb. 25, 2009
Applicants:
Lurong Zhang, Gainesville, FL (US);
Paul Okunieff, Gainesville, FL (US);
Lulu Zhang, Gainsville, FL (US);
Aiguo Zhang, Fremont, CA (US);
Inventors:
Lurong Zhang, Gainesville, FL (US);
Paul Okunieff, Gainesville, FL (US);
Lulu Zhang, Gainsville, FL (US);
Aiguo Zhang, Fremont, CA (US);
Assignee:
Diacarta LLC, Hayward, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
This invention relates generally to methods for detecting cell damage as a consequence of pathophysiological or traumatic insults such as in a nuclear accident, bioterror attack, tumorigenesis, infections or in individuals with cardiovascular disease.