The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2013

Filed:

Jan. 23, 2009
Applicants:

Michael John Evans, Cambridge, GB;

Ian Stephen Gregory, Cambridge, GB;

Hideaki Page, Cambridge, GB;

Inventors:

Michael John Evans, Cambridge, GB;

Ian Stephen Gregory, Cambridge, GB;

Hideaki Page, Cambridge, GB;

Assignee:

TeraView Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.


Find Patent Forward Citations

Evans, Michael. (2013). Terahertz investigative system and method (U.S. Patent No. 8399838). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8399838

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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