The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Dec. 22, 2010
Applicants:
Shingo Tajima, Tokyo, JP;
Yoshihumi Mochida, Tokyo, JP;
Inventors:
Shingo Tajima, Tokyo, JP;
Yoshihumi Mochida, Tokyo, JP;
Assignee:
Elpida Memory, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
To include a comparison circuit that generates comparison results by comparing plural pieces of data simultaneously read via data lines with expected values, an AND gate that activates a first determination signal in response to a fact that at least one of the comparison results indicates a mismatch, and an OR gate that activates a second determination signal in response to a fact that all the comparison results indicate a mismatch. With this arrangement, when a detection test of a defective address is performed in a wafer state, a defect of a column selection line can be detected.