The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Mar. 02, 2010
Applicants:

Marvin Krym, Nepean, CA;

Jozef Babiarz, Kanata, CA;

Lambertus Verberk, Woodlawn, CA;

Xiao-gao Liu, Kanata, CA;

Tarak Shingne, Ottawa, CA;

Inventors:

Marvin Krym, Nepean, CA;

Jozef Babiarz, Kanata, CA;

Lambertus Verberk, Woodlawn, CA;

Xiao-Gao Liu, Kanata, CA;

Tarak Shingne, Ottawa, CA;

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A communication system is provided that can control which communication sessions with mobile devices are admitted to a wireless access point. The admission decisions are based on actual measurements of radio frequency (RF) utilization. The RF utilization is determined on a per access class basis. Access classes may be defined by protocol but are, generally, voice, video and data. Thus, the system provides the ability to determine admissions that allows for the incorporation of factors including collisions, the distance from the access point to which a mobile device is communicating, and other factors.


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Krym, Marvin. (2013). Practical measurement-based session admission control for wi-fi lan systems (U.S. Patent No. 8385197). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8385197

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