The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2013

Filed:

Mar. 25, 2011
Applicants:

Yuh-lin E. Chang, Fremont, CA (US);

Stewart N. Taylor, Los Altos, CA (US);

Michael F. Fallon, Tiverton, RI (US);

Inventors:

Yuh-Lin E. Chang, Fremont, CA (US);

Stewart N. Taylor, Los Altos, CA (US);

Michael F. Fallon, Tiverton, RI (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems and computer program products to improve the efficiency and computational speed of an image enhancement process. In an embodiment, information that is generated as interim results during feature extraction may be used in a segmentation and classification process and in a content adaptive enhancement process. In particular, a cleaner image that is generated during a noise removal phase of feature extraction may be used in a content adaptive enhancement process. This saves the content adaptive enhancement process from having to generate a cleaner image on its own. In addition, low-level segmentation information that is generated during a neighborhood analysis and cleanup phase of feature extraction may be used in a segmentation and classification process. This saves the segmentation and classification process from having to generate low-level segmentation information on its own.


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