The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Jun. 17, 2009
Akiyoshi Irisawa, Miyagi, JP;
Shigeki Nishina, Miyagi, JP;
Akiyoshi Irisawa, Miyagi, JP;
Shigeki Nishina, Miyagi, JP;
Advantest Corporation, Tokyo, JP;
Abstract
The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A containercontains at least part of a device under testto be measured by a terahertz wave measurement device. The containerincludes a gap portionthat internally arranges at least a part of the device under test, and an enclosure portionthat includes a first curved surface portion S, and a second curved surface portion S, and arranges the gap portionbetween the first curved surface portion Sand the second curved surface portion S, thereby enclosing the gap portion. Moreover, a relationship n<nholds where nis the refractive index of the enclosure portion, and nis the refractive index of the device under test. Further, both the first curved surface portion Sand the second curved surface portion Sare convex surfaces.