The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2013

Filed:

Jul. 08, 2010
Applicants:

Dieter Lingenberg, Hürth, DE;

Reinhard Prause, St. Augustin, DE;

Inventors:

Dieter Lingenberg, Hürth, DE;

Reinhard Prause, St. Augustin, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for the non-destructive ultrasound inspection of a high-pressure line as a testing piece by means of the pulse-echo method, where the high-pressure line is conveyed to a near-field range of at least one ultrasonic transducer and an ultrasonic pulse is emitted with a perpendicular sound incidence on the high-pressure line in such a way that the high-pressure line is completely captured in its cross section by the near-field sound emission caused by the ultrasonic transducer, and the reflected ultrasonic pulse(s) is/are received by the ultrasonic transducer and/or, optionally, further ultrasonic transducers, the associated echo delay times are recorded and, optionally, evaluated.


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