The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Feb. 18, 2010
Changsung Seok, Gwacheon-si, KR;
Hongsun Park, Pohang-si, KR;
Jongil Weon, Seoul, KR;
Abstract
A scratch testing apparatus for performing a scratching test while gradually increasing or decreasing a load, in which a pressure applied to the surface of a test specimen gradually increases or decreases as a head unit, to which a tip is attached, moves horizontally. The scratching testing apparatus includes a head unit having a bottom to which a tip attached; a guiding unit for guiding the head unit to move horizontally; and a pressure changing unit for changing pressure applied to the tip while the head unit is moving along the guiding unit. Therefore, the scratch testing apparatus may perform a scratching test as gradually increasing or gradually decreasing a load applied to the test specimen by the tip by moving the head unit, to which the tip is attached, horizontally.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile