The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Jun. 10, 2008
Applicants:

Takayuki Akita, Tokyo, JP;

Eiji Kanoh, Tokyo, JP;

Masayuki Kawabata, Tokyo, JP;

Inventors:

Takayuki Akita, Tokyo, JP;

Eiji Kanoh, Tokyo, JP;

Masayuki Kawabata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); H04B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a sampling apparatus that samples a signal under measurement, including a sampling section that samples the signal under measurement with a plurality of sampling phases at non-uniform intervals for each sampling repetition cycle; and an inverting section that cancels out a replica that is not an observation target, from among the replicas in a sampling band of the signal under measurement and the replicas in the sampling band of a frequency component of the signal under measurement, by inverting signs of values of the signal under measurement sampled with at least one sampling phase from among the plurality of sampling phases.


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