The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Nov. 22, 2007
Akira Nara, Tokyo, JP;
Akira Nara, Tokyo, JP;
Tektronix, Inc., Beaverton, OR (US);
Abstract
A first frequency analysis range and a second frequency analysis range narrower than the first one are set with an operation panel, etc. A first signal pathproduces first time domain data of a frequency converted signal under test by a first data production rate depending on the first frequency analysis range. A second signal pathproduces second time domain data of frequency converted signal under test by a second data production rate depending on the second frequency analysis range and slower than the first data production rate. A CPU receives the first and second time domain data in parallel and produces first and second frequency domain data by FFT wherein frequency shift amounts in the frequency conversions in the first and second signal paths are different depending on the difference between the center frequencies of the first and second frequency analysis ranges.