The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2013

Filed:

Oct. 08, 2007
Applicants:

Thomas Haggerty, Blackwood, NJ (US);

Robert H. Brady, Brookfield, CT (US);

Inventors:

Thomas Haggerty, Blackwood, NJ (US);

Robert H. Brady, Brookfield, CT (US);

Assignee:

Metrologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of selectively generating one or more scan lines from a multi-scan line scanner involves measuring the pulse widths of the pulses in a signal output of a motor driving the polygon mirror of the scanner wherein the signal relates to the position of the polygon's mirror facets. By measuring and distinguishing each of the pulses in the signal, the illumination of the scan beam can be synchronized with the rotation of the polygon mirror to only generate a desired number of scan line patterns that is less than the full complement of the scan line patterns capable of being generated by the multi-scan line scanner.

Published as:

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