The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2013
Filed:
Jul. 21, 2010
Applicants:
Juan Liu, Milpitas, CA (US);
Ying Zhang, Cupertino, CA (US);
Gabriel Hoffmann, Palo Alto, CA (US);
Inventors:
Assignee:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for aligning maps using polyline matching is provided. A global map and a local map are represented as polyline maps including a plurality of line segments. One or more approximate matches between the polyline maps are identified. One or more refined matches are determined from the approximate matches. The global map and the local map are aligned at the one or more refined matches.