The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2013
Filed:
Nov. 30, 2009
Takuya Matsui, Mito, JP;
Satoshi Takahashi, Hitachinaka, JP;
Takanobu Haga, Kokubunji, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An object of the present invention relates to observation of single molecule fluorescence while temperature of a sample solution is controlled by a temperature controller and intrinsic fluorescence of the temperature controller is avoided, in a total internal reflection microscope. The present invention relates to provision of an opening at areas of the temperature controller through which incident light and reflected light pass, and configuration adopting a material with intrinsic fluorescence lower than that of the other parts, in a total internal reflection microscope including a prism and the temperature controller. The present invention enables intrinsic fluorescence of the temperature controller to be suppressed, which allows highly sensitive fluorescence observation while controlling sample solution temperature with high precision. For instance, this in turn allows the throughput of single molecule DNA sequencing using a total internal reflection microscope to be improved.