The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8358682 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 22, 2013

Filed:

Oct. 15, 2009
Applicant:

Koji Asami, Saitama, JP;

Inventor:

Koji Asami, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a reference data converting section that rearranges each of a plurality of frequency components along the frequency axis such that (i) a fundamental wave component and harmonic wave components of a reference digital signal are within a first Nyquist region of a spectrum of the reference digital signal and (ii) image components of the fundamental wave component and the harmonic wave components are within a second Nyquist region of the spectrum; and a distortion detecting section that detects the non-linear distortion of the reference digital signal caused by each harmonic wave component, based on each harmonic wave component having a prescribed order number in the spectrum in which each frequency component has been rearranged by the reference data converting section.


Find Patent Forward Citations

Asami, Koji. (2013). Signal processing apparatus, test system, distortion detecting apparatus, signal compensation apparatus, analytic signal generating apparatus, recording medium and analytic signal generating method (U.S. Patent No. 8358682). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8358682

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