The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Nov. 17, 2008
John W. Hamer, Rochester, NY (US);
Gary Parrett, Rochester, NY (US);
Charles I. Levey, West Henrietta, NY (US);
John W. Hamer, Rochester, NY (US);
Gary Parrett, Rochester, NY (US);
Charles I. Levey, West Henrietta, NY (US);
Global OLED Technology LLC, Herndon, VA (US);
Abstract
Compensation is performed for initial nonuniformity or aging of drive transistors and electroluminescent (EL) emitters in 3T1C EL subpixels of an EL display, such as an organic light-emitting diode (OLED) display. A readout transistor connected to the EL emitter is used to readout the voltage of the emitter and compensation for ΔV, ΔV, and OLED efficiency loss is performed using a model. Measurements are taken during a frame by driving a target subpixel at a higher luminance for a shorter time, then using the remaining time in the frame to measure. Measurements can be taken with an A/D converter or with a ramp generator and comparator. Compensation is performed for each subpixel individually.