The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2013

Filed:

Sep. 29, 2008
Applicants:

Juan Jenny LI, Basking Ridge, NJ (US);

David Mandel Weiss, Long Valley, NJ (US);

Inventors:

Juan Jenny Li, Basking Ridge, NJ (US);

David Mandel Weiss, Long Valley, NJ (US);

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mechanism for encoding and reporting instrumented data is disclosed that requires less storage space and incurs less processor overhead than other methods of the prior art. In accordance with the illustrative embodiment, a bit vector in shared memory corresponds to nodes of a program's control-flow graph that have been instrumented, and the contents of the vector indicate which of these nodes have executed; in addition, character strings in shared memory indicate what file, class, and method each node belongs to. A process that executes concurrently with those of the program under test transmits instrumented data from the shared memory to a database. The illustrative embodiment enables efficient, rapid reporting and storage of instrumented data, and is therefore especially well-suited for run-time analysis of real-time concurrent systems.


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