The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Jul. 06, 2009
Applicants:

Akhil Garg, Gautam Budh Nagar, IN;

Prashant Dubey, Allahabad, IN;

Inventors:

Akhil Garg, Gautam Budh Nagar, IN;

Prashant Dubey, Allahabad, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

The system and method are for efficient detection and restoration of data storage array defects. The system may include a data storage subsystem, wherein the data storage subsystem includes a data storage array, read-write logic coupled to the data storage array, a parity generator for producing and storing check data during write operations to the data storage array and generating check data during read operations on the data storage array, and a parity checker for verifying the stored check data with generated check data and identifying defective data read-write elements during read operations on the data storage array. The subsystem may further include a Built-in Self Test (BIST) generator operating only on the identified defective data read-write elements for determining defective data storage elements in the defective data read-write elements, and a restoration mechanism for restoring the valid operation of data access elements containing the defective data storage elements in the data storage array.


Find Patent Forward Citations

Loading…