The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Jul. 23, 2010
Michael Wuestenbecker, Luetjensee, DE;
Ingo Stuke, Reinfeld, DE;
Michael Wuestenbecker, Luetjensee, DE;
Ingo Stuke, Reinfeld, DE;
GE Sensing & Inspection Technologies GmbH, Huerth, DE;
Abstract
A method and system for automated testing and/or measurement of a plurality of substantially identical components by means of X-ray radiation comprises a testing/measuring device with an X-ray device, a protection cabin surrounding the testing/measuring device, a conveying device for continuously conveying components to or away from the testing/measuring device, and a control/evaluation unit, which is set up for automated control of the system and for evaluation of the X-ray signals. The testing/measuring device comprises a support and a rotor mounted on the support so as to be continuously rotatable, the X-ray device being arranged on the rotor and the conveying device being set up for serial conveying of the components through the rotor and the control/evaluation unit for computer tomographic evaluation of the X-ray signals.