The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Jul. 24, 2009
Applicants:

Howard H. Chen, Yorktown Heights, NY (US);

Kai D. Feng, Hopewell Junction, NY (US);

Louis L. Hsu, Fishkill, NY (US);

Seongwon Kim, Old Tappan, NJ (US);

Inventors:

Howard H. Chen, Yorktown Heights, NY (US);

Kai D. Feng, Hopewell Junction, NY (US);

Louis L. Hsu, Fishkill, NY (US);

Seongwon Kim, Old Tappan, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01G 7/16 (2006.01); G01R 31/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A high-density deep trench capacitor array with a plurality of leakage sensors and switch devices. Each capacitor array further comprises a plurality of sub-arrays, wherein the leakage in each sub-array is independently controlled by a sensor and switch unit. The leakage sensor comprises a current mirror, a transimpedance amplifier, a voltage comparator, and a timer. If excessive leakage current is detected, the switch unit will automatically disconnect the leaky capacitor module to reduce stand-by power and improve yield. An optional solid-state resistor can be formed on top of the deep trench capacitor array to increase the temperature and speed up the leakage screening process.


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