The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Jun. 04, 2008
Applicant:

Eric J. Meisenzahl, Ontario, NY (US);

Inventor:

Eric J. Meisenzahl, Ontario, NY (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/335 (2011.01); H04N 3/12 (2006.01); H01L 31/232 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image sensor includes a substrate having a plurality of photosensitive areas, a light shield positioned spanning the photosensitive areas in which light shield a plurality of apertures are formed, and a plurality of microlens each disposed centered on one of the apertures such that a focal point of the incident light through each microlens is substantially extended into the substrate to a point where a portion of the incident light directed onto the periphery of each microlens is blocked by a light shield.


Find Patent Forward Citations

Meisenzahl, Eric. (2013). Image sensors with improved angle response (U.S. Patent No. 8350952). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8350952

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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