The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Sep. 18, 2008
Christopher Power, Jena, DE;
Helmut Lippert, Jena, DE;
Dietrich Christian, Jena, DE;
Benno Radt, Jena, DE;
Christopher Power, Jena, DE;
Helmut Lippert, Jena, DE;
Dietrich Christian, Jena, DE;
Benno Radt, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method and an arrangement for analyzing a specimen, wherein the specimen is supported so as to be rotatable around an axis of rotation and displaceable in all three spatial directions and is illuminated by a first illumination device. Light radiated from the specimen is imaged on a detection device. A plurality of sectional images of the specimen are recorded at different settings of the rotational angle, and the specimen is rotated. The recorded sectional images are fused to form a data set of spatial image data of the specimen. The specimen is then illuminated by a second illumination device perpendicular to the axis of rotation, wherein a plurality of shadow images of the specimen are recorded and the specimen is rotated. A second data set of spatial image data of the specimen is constructed from the recorded shadow images by means of a back projection algorithm.