The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Apr. 26, 2012
Applicants:

Wen-chiao Ho, Tainan, TW;

Chin-hung Chang, Tainan, TW;

Chun-hsiung Hung, Hsinchu, TW;

Kuen-long Chang, Taipei, TW;

Inventors:

Wen-Chiao Ho, Tainan, TW;

Chin-Hung Chang, Tainan, TW;

Chun-Hsiung Hung, Hsinchu, TW;

Kuen-Long Chang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 7/02 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for checking reading errors of a memory includes the following steps. A first data fragment is received. A first count index according to the first data fragment is generated, wherein the first count index is corresponding to a quantity of one kind of binary value in the first data fragment. The first data fragment is written into the memory. The first data fragment is read from the memory as a second data fragment. A second count index is generated according to the second data fragment. The first count index is compared with the second count index.


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