The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Sep. 29, 2006
Applicants:

Alexander Maltsev, Nizhny Novgorod, RU;

Alexey Rubstov, Novgorod, RU;

Alexei Davydov, Nizhny Novgorod, RU;

Sergey Tiraspolsky, Nizhny Novgorod, RU;

Andrey Pudeyev, Nizhny Novgorod, RU;

Inventors:

Alexander Maltsev, Nizhny Novgorod, RU;

Alexey Rubstov, Novgorod, RU;

Alexei Davydov, Nizhny Novgorod, RU;

Sergey Tiraspolsky, Nizhny Novgorod, RU;

Andrey Pudeyev, Nizhny Novgorod, RU;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for determining a channel quality indicator (CQI) to be used in link adaptation for Orthogonal Frequency Division Multiplexing (OFDM) communications. In one embodiment of the invention, the CQI is based on a set of capacity values for subcarrier components in a received OFDM signal. In another embodiment, a minimum value from a running average of the set of capacity values is used to determine the CQI.


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