The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8344417 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 01, 2013

Filed:

Jan. 27, 2012
Applicants:

T. Warren Weeks, Jr., Raleigh, NC (US);

Edwin L. Piner, Cary, NC (US);

Thomas Gehrke, Apex, NC (US);

Kevin J. Linthicum, Angier, NC (US);

Inventors:

T. Warren Weeks, Jr., Raleigh, NC (US);

Edwin L. Piner, Cary, NC (US);

Thomas Gehrke, Apex, NC (US);

Kevin J. Linthicum, Angier, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/72 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides semiconductor materials including a gallium nitride material layer formed on a silicon substrate and methods to form the semiconductor materials. The semiconductor materials include a transition layer formed between the silicon substrate and the gallium nitride material layer. The transition layer is compositionally-graded to lower stresses in the gallium nitride material layer which can result from differences in thermal expansion rates between the gallium nitride material and the substrate. The lowering of stresses in the gallium nitride material layer reduces the tendency of cracks to form. Thus, the invention enables the production of semiconductor materials including gallium nitride material layers having few or no cracks. The semiconductor materials may be used in a number of microelectronic and optical applications.


Find Patent Forward Citations

Weeks, Jr., T.. (2013). Gallium nitride semiconductor structures with compositionally-graded transition layer (U.S. Patent No. 8344417). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8344417

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