The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Dec. 17, 2008
Hiroki Mori, Hitachinaka, JP;
Yasuo Kaneko, Hitachinaka, JP;
Toshihide Orihashi, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A diluted sample is reused to remeasure a sample whose measurement has been completed, which is to be manually performed. An automatic analyzer can set hold and discard conditions and manage the elapsed time after a diluted sample is pipetted. It is possible to check, before measurement is performed, whether or not each requested measurement item can be measured, and the length of time it takes before measurement of all samples is completed. The automatic analyzer has functions of: setting diluted sample hold and discard conditions; allowing an operator to specify a kind of sample, for example, to select between a parent sample and a diluted sample; separately executing pipetting or measurement; and displaying each requested measurement item for which a sample or a reagent is insufficient, and displaying the length of time it takes until measurement of all samples is completed.