The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Jan. 07, 2008
Applicants:

Chun-hsiung Hung, Hsinchu, TW;

Kuen-long Chang, Taipei, TW;

Chia-he Liu, Taoyuan, TW;

Inventors:

Chun-Hsiung Hung, Hsinchu, TW;

Kuen-Long Chang, Taipei, TW;

Chia-He Liu, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for reading data in an integrated circuit includes receiving a read command, which is associated with an enhanced data read, and receiving a first address from a plurality of input/output pins. The method includes receiving a first performance enhancement indicator and determining whether an enhanced read operation is to be performed based on at least information associated with the first performance enhancement indicator. The method includes waiting n clock cycles, where n is an integer, then outputting data from a memory array in the integrated circuit using the plurality of input/output pins concurrently. The method also includes performing an enhanced read operation, if it is determined that the enhanced read operation is to be performed. In an embodiment of the method, performing an enhanced read operation includes receiving a second address and a second performance enhance indicator without receiving a read command.


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