The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jul. 17, 2008
William Cote, Poughquag, NY (US);
Michael P. Guse, Hopewell Junction, NY (US);
Mark E. Lagus, Stanfordville, NY (US);
James Rice, Danbury, CT (US);
Yunsheng Song, Poughkeepsie, NY (US);
William Cote, Poughquag, NY (US);
Michael P. Guse, Hopewell Junction, NY (US);
Mark E. Lagus, Stanfordville, NY (US);
James Rice, Danbury, CT (US);
Yunsheng Song, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.