The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Jul. 10, 2007
Applicants:

Maarten Kuijper, Eindhoven, NL;

Stefan Geusens, Eindhoven, NL;

Sung-yao Lin, Taipei, TW;

Inventors:

Maarten Kuijper, Eindhoven, NL;

Stefan Geusens, Eindhoven, NL;

Sung-Yao Lin, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for obtaining focus optimization in an optical disc system is disclosed. The focus offset of a recording unit is set to a first of a plurality of predetermined values. A HF quality value is measured and stored for the selected focus offset value of the recording unit. The focus offset is then set to a best-known focus offset value. Tracks on the optical media being read are then jumped. The above steps are then repeated for each of the plurality of predetermined focus offset values. The optimal focus setting is then determined from the stored HF quality measurements.


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