The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Mar. 22, 2011
Paul Joseph Deangelo, West Bridgewater, MA (US);
Steven Abe Labreck, Boston, MA (US);
Paul Joseph Deangelo, West Bridgewater, MA (US);
Steven Abe Labreck, Boston, MA (US);
Olympus NDT Inc., Waltham, MA (US);
Abstract
Disclosed is a method and an NDT/NDI calibration process that automatically detects erroneous TOF readings by providing a predetermined time acceptance window. During the calibration process, TOF readings acquired by a UT device are validated to determine whether the TOF reading for the thin test block falls within the range of the predetermined time acceptance window. If the TOF reading for the thin block (T) falls out of the predetermined time acceptance window, the operator is alerted of an error and to repeat the TOF test for the thin block.