The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2012
Filed:
Sep. 29, 2009
James A. Culp, Newburgh, NY (US);
Jerry D. Hayes, Georgetown, TX (US);
Ying Liu, Austin, TX (US);
Anthony D. Polson, Jericho, VT (US);
James A. Culp, Newburgh, NY (US);
Jerry D. Hayes, Georgetown, TX (US);
Ying Liu, Austin, TX (US);
Anthony D. Polson, Jericho, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Mechanisms are provided for characterizing long range variability in integrated circuit manufacturing. A model derivation component tests one or more density pattern samples, which are a fabricated integrated circuits having predetermined pattern densities and careful placement of current-voltage (I-V) sensors. The model derivation component generates one or more empirical models to establish range of influence of long range variability effects in the density pattern sample. A variability analysis component receives an integrated circuit design and, using the one or more empirical models, analyzes the integrated circuit design to isolate possible long range variability effects in the integrated circuit design.