The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Jul. 29, 2008
Applicants:

Gerald K Bartley, Rochester, MN (US);

Darryl J Becker, Rochester, MN (US);

Paul E Dahlen, Rochester, MN (US);

Philip R Germann, Oronoco, MN (US);

Andrew B Maki, Rochester, MN (US);

Mark O Maxson, Mantorville, MN (US);

Inventors:

Gerald K Bartley, Rochester, MN (US);

Darryl J Becker, Rochester, MN (US);

Paul E Dahlen, Rochester, MN (US);

Philip R Germann, Oronoco, MN (US);

Andrew B Maki, Rochester, MN (US);

Mark O Maxson, Mantorville, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus and associated method of detecting microchip tampering may include a conductive element in electrical communication with multiple sensors for verifying that signal degradation occurs at an expected region of the conductive element. A detected variance from the expected region may automatically trigger an action for impeding an integrated circuit exploitation process.


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