The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Apr. 23, 2010
Applicants:

Feng Lin, Boise, ID (US);

Roman Andreas Royer, Boise, ID (US);

Inventors:

Feng Lin, Boise, ID (US);

Roman Andreas Royer, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of phase-generation circuitry and methods for generating a multiphase signal with duty-cycle correction are generally described herein. The phase-generation circuitry may include a plurality of controllable delay stages arranged in series and phase detector circuitry. Each delay stage may be configured to phase shift a differential signal based on a control signal. The phase detector circuitry may be configured to generate the control signal based on a first time difference and a second time difference. The first time difference may be a time difference between rising edges of a first component of the differential signal and a second component of a phase-shifted signal. The second time difference may be a time difference between falling edges of the first component of the differential signal and the second component of the phase-shifted signal. Other circuits, systems, and methods are described.


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