The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8329515 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 11, 2012

Filed:

Dec. 28, 2009
Applicants:

Bin Yang, Mahwah, NJ (US);

Man Fai NG, Poughkeepsie, NY (US);

Inventors:

Bin Yang, Mahwah, NJ (US);

Man Fai Ng, Poughkeepsie, NY (US);

Assignee:

Globalfoundries Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/82 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eFUSE is formed with a gate stack including a layer of embedded silicon germanium (eSiGe) on the polysilicon. An embodiment includes forming a shallow trench isolation (STI) region in a substrate, forming a first gate stack on the substrate for a PMOS device, forming a second gate stack on an STI region for an eFUSE, forming first embedded silicon germanium (eSiGe) on the substrate on first and second sides of the first gate stack, and forming second eSiGe on the second gate stack. The addition of eSiGe to the eFUSE gate stack increases the distance between the eFUSE debris zone and an underlying metal gate, thereby preventing potential shorting.


Find Patent Forward Citations

Yang, Bin. (2012). Efuse enablement with thin polysilicon or amorphous-silicon gate-stack for hkmg cmos (U.S. Patent No. 8329515). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8329515

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