The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Jul. 07, 2011
Antonietta Oliva, San Jose, CA (US);
Gregory S. Scott, Santa Clara, CA (US);
Edgardo F. Klass, Palo Alto, CA (US);
Vincent R. Von Kaenel, Palo Alto, CA (US);
Antonietta Oliva, San Jose, CA (US);
Gregory S. Scott, Santa Clara, CA (US);
Edgardo F. Klass, Palo Alto, CA (US);
Vincent R. von Kaenel, Palo Alto, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A software tool and method for analyzing the reliability or failure rate of an integrated circuit (IC) are disclosed. The IC may include a plurality of circuit designs, and the software tool and method may aid a designer of the IC in determining a reliability rating of the IC based on reliability ratings of transistors or other circuit devices used in the circuit designs. In particular, the IC may include one or more circuit designs that have multiple instances within the IC (i.e., the same circuit design is instantiated multiple times), and the software tool and method may take into account the multiple instances when determining the reliability rating of the IC.